New Electron Microscope to Strengthen VUJE’s Advanced Analytical Capabilities

The device will expand the capabilities of the advanced experimental laboratory by enabling detailed imaging of microstructures with nanometer-level resolution. The JSM-IT210 SEM represents the pinnacle in its class, offering a compact design, an intuitive analytical interface, and integrated EDS X-ray elemental analysis for comprehensive material studies. Delivery of the equipment is expected in August 2025, complementing the existing electron microscope located in the active laboratories at Jaslovské Bohunice.

Materials specialists Marek Adamech, Dávid Slnek, Juraj Ďurica, and department head Jana Petzová participated in professional training in April 2025 at the JEOL Europe Demo Center in Croissy-sur-Seine, Paris, where they tested the new microscope in action. Under the guidance of experienced SEM operator Tangyu Rocher and JEOL representative Zuzana Srbková, they acquired the knowledge necessary to deliver valuable results for both the department’s operations and VUJE, a.s., from the very beginning.

"Our work requires precision, reliability, and the ability to capture even the finest details of material degradation. That is exactly why this microscope is a tremendous asset for us," confirms Jana Petzová. "We are very excited about the new equipment, which takes microstructure observation combined with an advanced software interface to an entirely new level," adds materials specialist Marek Adamech.

From left Zuzana Srbková, Marek Adamech, Jana Petzová.

The activities of the material laboratories within our division focus primarily on evaluating the material properties of structural steels, identifying degradation and corrosion mechanisms, and preparing expert assessments within monitoring programs. Microscopic technologies capable of imaging material microstructures at magnifications ranging from tens of thousands to several hundred thousand times play a key role in these processes.

With this new device, VUJE gains not only a technological advantage but also makes another step toward excellence in nuclear equipment diagnostics and material analysis reliability. This investment is a testament to the company’s long-term strategy of continuously enhancing its level of expertise and technical infrastructure.

That's him. Modern scanning electron microscope (SEM) JSM-IT210 from the renowned Japanese company JEOL.